Scout 350 HAR Silicon AFM Probes, Pk 10
Scout HAR Silicon AFM Probes High Aspect Ratio Probe Tips
Reliable imaging every time. Rigorous inspection of every probe means each one performs as you expect. Pack of 10 AC mode silicon AFM probes with a high aspect ratio tip. Ideal for deep trench imaging with non-contact/tapping modes in air, on hard samples, and stable softer samples.
Available:
Uncoated.
Aluminum backside coating.
Gold reflective backside coating.
High aspect ratio: Cone angle of < 15 ° over the final 1 μm of the tip. Minimal variation in spring constant and resonant frequency.
Cantilever Specifications
| Parameter | Nominal | Range |
| Spring constant (N/m) | 42 | 25 - 70 |
| Resonant frequency (kHz) | 350 | 300 - 400 |
| Shape | Rectangular | |
| Length (µm) | 125 | 123 - 127 |
| Width (µm) | 30 | 28 - 32 |
| Thickness (µm) | 4.5 | 4.0 - 5.0 |
| Material | Silicon (n-type, Antimony) | |
| Resistivity (Ωcm) | 0.02 | 0.015 - 0.025 |
Tip Specification
| Parameter | Nominal | Range |
| Radius (nm) | 5 | < 10 |
| Height (µm) | 7 | 5 - 8 |
| Set back (µm) | 7.5 | 6.5 - 8.5 |
| Shape | Conical | |
| Cone Angle (°) | 15° over the last 1 µm of the tip | |
| Material | Silicon (n-type, Antimony) | |
| Resistivity (Ωcm) | 0.02 | 0.015 - 0.025 |
Note: Nominal values for spring constants and resonant frequencies are calculated using well-known formulae and based on expected probe dimensions. The ranges are calculated using measured dimensions.
Option reflective coatings:
Aluminium: Frontside/Tip - None, Backside/Reflective - 40 nm Al
Gold: Frontside/Tip - None, Backside/Reflective - 5 nm Ti, 50 nm Au