Scout 70 HAR Silicon AFM Probes, Pk 10
Scout HAR Silicon AFM Probes High Aspect Ratio Probe Tips
Reliable imaging every time. Rigorous inspection of every probe means each one performs as you expect. Pack of 10 general purpose AC mode silicon AFM probes with a high aspect ratio tip. Ideal for deep trench imaging with non-contact/soft tapping and force modulation modes in air, on softer samples.
Available:
Uncoated.
Aluminum backside coating.
Gold reflective backside coating.
High aspect ratio: Cone angle of < 15 ° over the final 1 μm of the tip. Minimal variation in spring constant and resonant frequency.
Cantilever Specifications
| Parameter | Nominal | Range |
| Spring constant (N/m) | 2 | 0.5 - 3.5 |
| Resonant frequency (kHz) | 70 | 45 - 80 |
| Shape | Rectangular | |
| Length (µm) | 225 | 223 - 227 |
| Width (µm) | 30 | 29 - 31 |
| Thickness (µm) | 2.5 | 2.0 - 3.0 |
| Material | Silicon (n-type, Antimony) | |
| Resistivity (Ωcm) | 0.02 | 0.015 - 0.025 |
Tip Specification
| Parameter | Nominal | Range |
| Radius (nm) | 5 | < 10 |
| Height (µm) | 7 | 5 - 8 |
| Set back (µm) | 7.5 | 6.5 - 8.5 |
| Shape | Conical | |
| Cone Angle (°) | 25 | 15 - 40 |
| Material | Silicon (n-type, Antimony) | |
| Resistivity (Ωcm) | 0.02 | 0.015 - 0.025 |
Note: Nominal values for spring constants and resonant frequencies are calculated using well-known formulae and based on expected probe dimensions. The ranges are calculated using measured dimensions.
Option reflective coatings:
Aluminium: Frontside/Tip - None, Backside/Reflective - 40 nm Al
Gold: Frontside/Tip - None, Backside/Reflective - 5 nm Ti, 50 nm Au