SPI Supplies Brand Carbon Black Specimen on TEM Grid for Lattice Plane Calibration

This sample is a partially graphitized specimen, supported by a high purity, structureless and featureless carbon film, itself on a copper grid. In diffraction mode, this specimen provides a lattice spacing of 0.34nm and being that this is a materials constant, it works as an outstanding resolution test specimen. Supplied on a 3.05 mm 200 mesh copper grid.