Tin on Carbon SEM Image Resolution Checker Specimen (specify mount)
| Availability | Contact for Availability |
|---|---|
| Item | 02863-AB |
This carefully made specimen was designed for resolution testing in the SEM equipped with tungsten, Lab6 or field emission gun (e.g. FEG) emitters. Like the highly used and popular SPI Gold- on-Carbon Resolution Test Sample, the "test" is to image the individual particles of metal against the carbon background and visually determine the minimum particle spacing at which the gap between particles can be clearly determined. The individual particles are nominally 30 nm in diameter, an ideal dimension for astigmatism correction in the SEM. The tin on carbon specimen is also an excellent image performance checker for operating in the backscattered electron (BSE) detection mode.
One note of caution:
This specimen is, quite frankly, more difficult to use than the gold-on-carbon sample, and we only suggest it for those laboratories where gold is forbidden, such as many laboratories in the semiconductor industry using CD-SEMs.
Storage conditions:
In order to extend its useful lifetime, we suggest storing this test specimen in either a desiccator or under an inert atmosphere using a SPI-Dry™ Sample Preserver Capsule.
Each SPI Tin-on-Carbon Resolution Test Sample is accompanied with easy-to-understand instructions for use. Please specify SPI Mount type part number when ordering.