SPARK 350 Pt Conductive AFM Probes - Pk 10
Availability | Contact for Availability |
---|---|
Item | 01079-AB |
SPARK 350 Pt Conductive AFM Probes
Robust, high-resolution probes for electrical characterization. Rigorous inspection of every probe means each one performs as you expect. Pack of 10 conductive AFM probes with platinum coating on both sides, suitable for electrical characterization in AC modes (non-contact/tapping). 40 nm platinum coating with a 5nm titanium adhesion layer on both sides of the probe and a tip radius of less than 30 nm.
Cantilever Specifications
Parameter | Nominal | Range |
Spring constant (N/m) | 42 | 25 - 70 |
Resonant frequency (kHz) | 350 | 300 - 400 |
Shape | Rectangular | |
Length (µm) | 125 | 123 - 127 |
Width (µm) | 30 | 28 - 32 |
Thickness (µm) | 4.5 | 4.0 - 5.0 |
Material | Silicon (n-type, Antimony) | |
Resistivity (Ωcm) | 0.02 | 0.015 - 0.025 |
Tip Specification
Parameter | Nominal | Range |
Radius (nm) | 18 | < 30 |
Height (µm) | 6 | 5 - 8 |
Set back (µm) | 7.5 | 6.5 - 8.5 |
Shape | Conical | |
Cone Angle (°) | 25 | 15 - 40 |
Material | Silicon (n-type, Antimony) | |
Resistivity (Ωcm) | 0.02 | 0.015 - 0.025 |
Coatings
Frontside/Tip
5nm Ti
40nm Pl
Backside/Reflective
5nm Ti
40nm Pt
Note: Nominal values for spring constants and resonant frequencies are calculated using well-known formulae and based on expected probe dimensions. The ranges are calculated using measured dimensions.