Click to enlarge
150-2D / 150-2DUTC
Very High Resolution Calibration Reference and Traceable Standard.
- Instruments: AFM, STM, Auger, FIB, and SEM.
- Pitch: 144 nm pitch +/- 1nm.
- Line Height: About 90 nm, width 75 nm, not calibrated.
- Feature: Two-dimensional array.
- Material: Aluminum bumps on Silicon.
- Size: 4 x 3 mm.
Model 150-2D is Non-traceable Calibration Reference
Model 150-2DUTC is Traceable, Certified Standard
Items in 150-2D / 150-2DUTC
